Catchphrase
FE-SEM equipped with a high-brightness field emission electron gun achieves higher resolution observation compared to conventional SEMs using thermal electron sources. It provides clear images even at low accelerating voltages and supports a wide range of applications, ideal for detailed observation of fine structures.

■ Overview
The Field Emission Scanning Electron Microscope (FE-SEM) uses a high-brightness field emission (FE) electron gun, enabling more precise observations compared to SEMs using traditional thermal electron sources. FE-SEM delivers high-resolution images even at low accelerating voltages, allowing detailed observation of the fine structures on sample surfaces. Additionally, the flexible combination of electron sources and lens types makes it highly adaptable to the specific requirements of various samples and applications, proving effective in diverse fields.

■ Features
- High-Brightness FE Electron Gun: Produces a denser electron beam compared to thermal electron sources, allowing for high-resolution observation of fine structures.
- High-Resolution at Low Accelerating Voltages**: Provides clear images even at low voltages, allowing delicate surface observations of samples.
- Flexible Lens and Electron Source Combinations**: Enables optimal observation settings according to the application or sample.
- **Sample-Friendly Observation**: Low voltage observations minimize damage to sensitive samples.
- **Wide Range of Applications**: Supports sample observation across various fields such as material science, biology, and semiconductors.

■ Specifications
- Electron Source: High-brightness field emission electron gun
- Resolution: Less than 1nm (at high accelerating voltage)
- Accelerating Voltage: 0.5kV to 30kV
- Observation Modes: Low voltage observation mode, secondary electron detection mode, backscattered electron detection mode
- Applications**: Material science, bioscience, semiconductor analysis, surface analysis

■ Applications
- Material Science: Analysis of surface structures and defects in metals, ceramics, polymers, etc.
- Bioscience: Detailed observation of cellular and tissue structures, as well as microbial surface observation.
- Semiconductor Analysis: High-resolution observation and process evaluation of fine wiring and device structures.
- Surface Analysis: Surface property evaluation of catalysts and nanomaterials.

Achieve precise sample analysis across a wide range of fields with high-resolution observation powered by the high-brightness FE electron gun.

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