Measuring equipment and testing machine

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Achieve high-precision inspections even on high-speed production lines with the AIRIS-SP320. A strong ally in quality control, missing no hard-to-detect defects.

The AIRIS ACE series surface defect inspection device, model: AIRIS-SP320, addresses the challenges of surface defect inspection in high-speed production lines. This device is optimized for the inspection of separator films and other materials, equipped with detection parameters that enable the identification of fine defects previously difficult to discern. Additionally, it features image processing simulation capabilities and supports multiple languages, offering flexibility in a global usage environment.

■ Features
Detection Parameters Optimized for Separator Films: Specialized detection parameters for applications such as separator films enable high-precision inspections.
Enhanced Functionality for Difficult-to-Distinguish Defects: Capable of reliably detecting fine defects and those previously difficult to identify.
Equipped with Image Processing Simulation Functionality: Allows for the simulation of inspections before actual implementation, enabling the setting of optimal inspection conditions.
Multi-language Support on the Same Platform: Supports Japanese, English, Chinese, and Korean, facilitating easy implementation and operation in international manufacturing lines.

■ Specifications
Model: AIRIS-SP320
Supported Languages: Japanese, English, Chinese, Korean
Features: High-speed line compatibility, high resolution, image processing simulation, multi-language support
Application Fields: Quality control of products where surface quality is critical, such as separator film inspections
The AIRIS-SP320 enables high-speed, high-resolution surface defect inspections, contributing to improved production quality. With its capability to detect hard-to-distinguish defects and user-friendly features, this device supports the enhancement of quality control across various production lines.

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